Radiation defects in ion implanted and/or high-energy irradiated MOS structures / S. Kaschieva and S.N. Dmitriev.
Material type:
TextLanguage: English Series: Electrical engineering developments seriesPublication details: New York : Nova Science Publishers, c2010.Description: ix, 195 p. : ill. (some col.) ; 24 cmISBN: - 9781608761883 (hbk.)
- 1608761886 (hbk.)
- 621.3815/2 22
- QC611.8.M4 K37 2010
| Item type | Current library | Call number | Copy number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|
წიგნები / Books
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ცენტრალური ბიბლიოთეკა / Central library ტექნიკური დარ. / Techn. hall | 621.381 / 3 (Browse shelf(Opens below)) | K - 9237 | Available | 2016-5326 |
Price. 25 L.
Includes bibliographical references and index.
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