High-Voltage and High-Current Id –Vds Measurement Method for Power Transistors Improved by Reducing Self-Heating. eResource / Yohei Nakamura, Naotaka Kuroda, Tatsuya Yanagi, Hiroyuki Sakairi, Ken Nakahara
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TextLanguage: English Publication details: 2020.Description: 4 pSubject(s):
| Item type | Current library | Call number | Copy number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|
ელ.უცხოური სტატია / eForeign Article
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ცენტრალური ბიბლიოთეკა / Central library კომპიუტერული დარ. / Computer hall | 621 / CD-6267 (Browse shelf(Opens below)) | 6267 | Available | 2024-4166 |
IEEE ELECTRON DEVICE LETTERS, VOL. 41, NO. 4, APRIL 2020
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